Proton Induced X-ray Emission, PIXE is a very well established analytical method. This technique of analysis can equally be applied both in vacuum, internal PIXE, and in atmosphere, external PIXE. External PIXE has been applied to material analysis in Van de Graaff laboratory at AEOI using filters and funny filters. Advantages of using these filters have been studied when analysing ancient written documents such as envelopes, inks, and newspapers. This technique clearly demonstrated the differences between new and old inks and papers. More data is needed to show other features of this technique.
