A reflectarray designed by Random Hill Climbing (RHC) optimization process is demonstrated and simulated. On the basis of the top layer effect on the reflection phase, and exploiting the relation between phase distribution and the direction of the reflected beam, six pixelated subcells are optimized for two incident angle waves simultaneously. The far field plot shows that for beams of incident angles 19.471o and 41.81o and in the precincts of them the reflectarray deflects the incident waves into reflections close to normal to the reflectarray surface. This shows a proximate independence of the deflection angle from the incident angle in a certain angular range. The proposed cells provide 〖342〗^o reflection phase range. The reflection loss of the cell for the incident angles 19.471o and 41.81o are -1.9 dB and -1.4 dB, respectively. The pattern gain and fractional bandwidth for a finite reflectarray of size 300λ×150λ are reported to be 19.44 dB and 25% for the incident angle 19.471o, and 19.17 dB and 30% for the incident angle 41.81o. The systematic design proposed in this paper could be generalized to arbitrary values and numbers of incident and deflection angles.
