A built-in self-test is the capability of hardware/software to test by itself. BIST techniques are divided into two main groups: offline and online. In this paper, a new concurrent BIST technique based on duplication design is presented. The proposed method uses a pre-computed test set, which is selected by a novel methodology instead of using a deterministic test pattern generation (TPG) algorithm. In the proposed method, two Linear Feedback Shift Registers (LFSR) are used to detect the required test patterns instead of a high complex and power hungry conventional pattern detector. As the main result, the area overhead is decreased 43.9% in comparison with the previous methods. In comparison with duplication design, a reduced version of CUT is used as golden circuit in our method. Clearly, some of the single stuck-at faults are not covered in the proposed design
